JEDEC JESD30HDescriptive Designation System for Semiconductor-device Packagesstandard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD37ALognormal Analysis of Uncensored Data, and of Singly Right-Censored Data Utilizing the Persson and Rootzen Methodstandard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD214.01CONSTANT-TEMPERATURE AGING METHOD TO CHARACTERIZE COPPER INTERCONNECT METALLIZATIONS FOR STRESS-INDUCED VOIDINGstandard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD22-A108FTEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JESD47JSTRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 08/01/2017
JEDEC JESD224AUniversal Flash Storage (UFS) Teststandard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JESD245BByte Addressable Energy Backed Interfacestandard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JEP175DDR4 Protocol Checksstandard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JESD250Graphics Double Data Rate (GDDR6) SGRAM Standardstandard by JEDEC Solid State Technology Association, 07/01/2017
JEDEC JESD79-4BDDR4 SDRAM Standardstandard by JEDEC Solid State Technology Association, 06/01/2017
JEDEC JS-001-2017ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Modal (HBM) - Component Levelstandard by JEDEC Solid State Technology Association, 05/12/2017
JEDEC JESD9CInspection Criteria for Microelectronic Packages and Coversstandard by JEDEC Solid State Technology Association, 05/01/2017