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JEDEC JESD659C

M00000007

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JEDEC JESD659C FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING

standard by JEDEC Solid State Technology Association, 04/01/2017

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This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625 after revision, September 1999.