New Reduced price! JEDEC JESD47J.01 View larger

JEDEC JESD47J.01

M00000031

New product

JEDEC JESD47J.01 STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

standard by JEDEC Solid State Technology Association, 09/01/2017

More details

In stock

$31.82

-57%

$74.00

More info

Full Description

This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.