Cart 0 Product Products (empty)
No products
To be determined Shipping
$0.00 Total
Product successfully added to your shopping cart
Quantity
Total
There are 0 items in your cart. There is 1 item in your cart.
Total products
Total shipping To be determined
Total
New Reduced price! 
View larger
View larger 
JEDEC JESD22-A100D
M00000099
New product
JEDEC JESD22-A100D CYCLED TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2013
In stock
More info
Full Description
The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages(e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.The Cycled Temperature-humidity "Biased Life Test is performed for the purpose of evaluating thereliability of non-hermetic, packaged solid state devices in humidity environments when surfacecondensation is likely. It employs conditions of bias, temperature cycling and high humidity that willcause condensation to occur on the device surface. It is useful to determine device surface susceptibilityto corrosion and/or dendritic growth.
For most applications test method JESD22-A110 "Highly Accelerated Temperature and Humidity StressTest (HAST)" or JESD22-A101 "Steady State Temperature, Humidity, Biased Life Test" is preferred.