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JEDEC JESD226

M00000111

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JEDEC JESD226 RF Biased Life (RFBL) Test Method

standard by JEDEC Solid State Technology Association, 01/01/2013

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This stress method is used to determine the effects of RF bias conditions and temperature on PowerAmplifier Modules (PAMs) over time. These conditions are intended to simulate the devices? operatingcondition in an accelerated way, and they are expected to be applied primarily for device qualification andreliability monitoring.