New Reduced price! JEDEC JEP122G View larger

JEDEC JEP122G

M00000130

New product

JEDEC JEP122G FAILURE MECHANISMS AND MODELS FOR SEMICONDUCTOR DEVICES

standard by JEDEC Solid State Technology Association, 10/01/2011

More details

In stock

$70.09

-57%

$163.00

More info

Full Description

This publication provides a list of failure mechanisms and their associated activation energies or acceleration factors that may be used in making system failure rate estimations when the only available data is based on tests performed at accelerated stress test conditions. The method to be used is the Sum-of-the-Failure-Rates method.