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JEDEC JESD 47G.01

M00000193

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JEDEC JESD 47G.01 STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS

standard by JEDEC Solid State Technology Association, 04/01/2010

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This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.

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Published: 04/01/2010 Number of Pages: 26File Size: 1 file , 240 KB