Full Description

This method establishes a standard procedure for determining the data cycling endurance and data retention capability of non-volatile memory cells. It is intended as a qualification and monitor test procedure. This test is also applicable to FLASH EEPROM integrated circuits and Erasable Programmable Logic Devices (EPLD) with embedded EEPROM or FLASH memory.

Product Details

Published: 03/01/2009 Number of Pages: 22File Size: 1 file , 170 KB