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21/30432242 DC. BS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices. Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever

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Standard Number21/30432242 DC
TitleBS IEC 62047-42. Semiconductor devices. Micro-electromechanical devices. Part 42. Measurement methods of electromechanical conversion characteristics of piezoelectric MEMS cantilever
StatusCurrent, Draft for public comment
Publication Date09 July 2021
Normative References(Required to achieve compliance to this standard)IEC 62047-30
Informative References(Provided for Information)No other standards are informatively referenced
International RelationshipsIEC 62047-42 ED1
Draft Expiry Date25 August 2021
DescriptorsSemiconductor diodes, Semiconductor rectifiers, Semiconductor resistors, Semiconductors, Semiconductor devices, Electronic equipment and components, Semiconductor technology
ICS31.080.99
CommitteeEPL/47
PublisherBSI
FormatA4
DeliveryYes
Pages22
File Size798 KB
NotesWarning: this draft is not current beyond its expiry date for comments.
Price£20.00