Full Description

IEC 62562:2010(E) describes a measurement method of dielectric properties in the planar direction of dielectric plate at microwave frequency. It has been created in order to develop new materials and to design microwave active and passive devices for which standardization of measurement methods of material properties is more and more important. It has the following characteristics:
- the relative permittivity and loss tangent tan values of a dielectric plate sample can be measured accurately and non-destructively;
- temperature dependence of complex permittivity can be measured;
the measurement accuracy is within 0,3 % for and within 5 x 10^-6 for tan;
- fringing effect is corrected using correction charts calculated on the basis of rigorous analysis. It is applicable for the measurements on the following condition:
- frequency: 2 GHz < < 40 GHz;
- relative permittivity: 2 < < 100;
- loss tangent: 10^-6 < tan < 10^-2. This first edition cancels and replaces the PAS published in 2008.

Product Details

Edition: 1.0 Published: 02/18/2010 Number of Pages: 20 File Size: 1 file , 1.2 MB