JEDEC JESD16BASSESSMENT OF AVERAGE OUTGOING QUALITY LEVELS IN PARTS PER MILLION (PPM)standard by JEDEC Solid State Technology Association, 11/01/2017
JEDEC JESD47J.01STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITSstandard by JEDEC Solid State Technology Association, 09/01/2017
JEDEC JESD8-30POD125 - 1.25 V PSEUDO OPEN DRAIN I/Ostandard by JEDEC Solid State Technology Association, 09/01/2017
JEDEC JESD245B.01Byte Addressable Energy Backed Interfacestandard by JEDEC Solid State Technology Association, 09/01/2017
JEDEC JESD22-A108ETEMPERATURE, BIAS, AND OPERATING LIFEstandard by JEDEC Solid State Technology Association, 12/01/2016
JEDEC JESD22-B106ERESISTANCE TO SOLDER SHOCK FOR THROUGH-HOLE MOUNTED DEVICESstandard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD227EMBEDDED MULTIMEDIACARD (e-MMC) SECURITY EXTENSIONstandard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD225UNIVERSAL FLASH STORAGE (UFS) SECURITY EXTENSIONstandard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD22-A113HPRECONDITIONING OF NONHERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTINGstandard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD22-B111ABOARD LEVEL DROP TEST METHOD OF COMPONENTS FOR HANDHELD ELECTRONIC PRODUCTSstandard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD22-A119ALOW TEMPERATURE STORAGE LIFEstandard by JEDEC Solid State Technology Association, 10/01/2015
JEDEC JESD22-A103EHIGH TEMPERATURE STORAGE LIFEstandard by JEDEC Solid State Technology Association, 10/01/2015